Pulse shape analysis in segmented detectors as a technique for background reduction in Ge double-beta decay experiments

被引：31

作者：

Elliott, SR

Gehman, VM

Kazkaz, K

Mei, DM

Young, AR

机构：

[1] Los Alamos Natl Lab, Los Alamos, NM 87545 USA

[2] Univ Washington, Seattle, WA 98195 USA

[3] N Carolina State Univ, Raleigh, NC 27695 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2006年 / 558卷 / 02期

关键词：

Ge-76; neutrinoless double-beta decay; Ge detectors; pulse shape analysis; segmentation;

D O I：

10.1016/j.nima.2005.12.024

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The need to understand and reject backgrounds in Ge-diode detector double-beta decay experiments has given rise to the development of pulse shape analysis in such detectors to discern single-site energy deposits from multiple-site deposits. Here, we extend this analysis to segmented Ge detectors to study the effectiveness of combining segmentation with pulse shape analysis to identify the multiplicity of the energy deposits. (c) 2005 Elsevier B. V. All rights reserved.

引用

页码：504 / 510

页数：7

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