Band approach to the excitation-energy dependence of x-ray fluorescence of TiO2

被引:39
作者
Finkelstein, LD
Kurmaev, EZ
Korotin, MA
Moewes, A
Schneider, B
Butorin, SM
Guo, JH
Nordgren, J
Hartmann, D
Neumann, M
Ederer, DL
机构
[1] Russian Acad Sci, Inst Met Phys, Ural Div, Yekaterinburg 620219, Russia
[2] Louisiana State Univ, CAMD, Baton Rouge, LA 70803 USA
[3] Univ Osnabruck, Fachbereich Phys, D-49069 Osnabruck, Germany
[4] Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden
[5] Tulane Univ, Dept Phys, New Orleans, LA 70118 USA
来源
PHYSICAL REVIEW B | 1999年 / 60卷 / 04期
关键词
D O I
10.1103/PhysRevB.60.2212
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Excitation-energy dependence of Ti L-2,L-3 soft x-ray emission spectra (XES) of a TiO2 single crystal is measured near Ti 2p threshold using tuneable synchrotron radiation at excitation energies E-exc = 458.2-476.9 eV. It is found that the emission spectra exhibit normal soft x-ray emission features, which do not change with excitation energy and inelastic and resonant x-ray emission features (RXES), which strongly depend on the excitation energy. We are using a band approach in order to discuss the excitation-energy dependence of Ti L-2,L-3 RXES of TiO2. The RXES process is described as a convolution of occupied and unoccupied d states in the intermediate and final states. In this procedure the d states are limited to those which lie in the energy interval E-exc +/- Delta E taking into account the rule of k conservation. We calculate the curves of restricted joint density of states using the full potential linearized muffin-tin orbital method and the results are found to be in reasonable agreement with the experimental Ti L-2,L-3, RXES of TiO2 measured at different excitation energies. [S0163-1829(99)12227-6].
引用
收藏
页码:2212 / 2217
页数:6
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