Superconducting Transition at 38 K in Insulating-Overdoped La2CuO4-La1.64Sr0.36CuO4 Superlattices: Evidence for Interface Electronic Redistribution from Resonant Soft X-Ray Scattering

被引：93

作者：

Smadici, S. ^{[1
]}

Lee, J. C. T. ^{[1
]}

Wang, S. ^{[1
]}

Abbamonte, P. ^{[1
]}

Logvenov, G. ^{[2
]}

Gozar, A. ^{[2
]}

Cavellin, C. Deville ^{[2
,3
]}

Bozovic, I. ^{[2
]}

机构：

[1] Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL 61801 USA

[2] Brookhaven Natl Lab, Upton, NY 11973 USA

[3] Univ Paris 12, F-94010 Creteil, France

来源：

PHYSICAL REVIEW LETTERS | 2009年 / 102卷 / 10期

关键词：

RECONSTRUCTION; OXIDES;

D O I：

10.1103/PhysRevLett.102.107004

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We use resonant soft x-ray scattering (RSXS) to quantify the hole distribution in a superlattice of insulating La2CuO4 (LCO) and overdoped La2-xSrxCuO4 (LSCO). Despite its nonsuperconducting constituents, this structure is superconducting with T-c=38 K. We found that the conducting holes redistribute electronically from LSCO to the LCO layers. The LCO layers were found to be optimally doped, suggesting they are the main drivers of superconductivity. Our results demonstrate the utility of RSXS for separating electronic from structural effects at oxide interfaces.

引用

页数：4

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