Transparent conducting impurity-co-doped ZnO:Al thin films prepared by magnetron sputtering

被引:130
作者
Minami, T [1 ]
Suzuki, S [1 ]
Miyata, T [1 ]
机构
[1] Kanazawa Inst Technol, Optoelect Device Syst R&D Ctr, Nonoichi, Ishikawa 9218501, Japan
关键词
magnetron sputtering; ZnO; co-doping; thin films; etching rate; transparent conducting oxide;
D O I
10.1016/S0040-6090(01)01303-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This report describes the effects of impurity-co-doping on transparent conducting Al-doped ZnO (AZO) films prepared by DC magnetron sputtering using a target composed of dopant powder added to a mixture of ZnO and Al2O3 powder. The chemical stability of transparent conducting AZO films could be improved by co-doping Cr or Co without significantly altering the original electrical and optical properties. A reduction in etching rate, as well as a low resistivity of 3.0 x 10(-4) Omega cm, was obtained in transparent conducting AZO:Cr films prepared using Zn powder added into the oxide target with an Al2O3, content of 2 wt.% and a Cr2O3 content of 1 wt.%. In addition, a reduction in etching rate, as well as low resistivity, was obtained in transparent conducting AZO:Co films prepared with an Al2O3 content of 2 wt.% and a Coo content of 0.5-2 wt.% or a CoCl2 content of 1.5-3 wt.%. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:53 / 58
页数:6
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