Characterization of the structure of Y-Ba-Cu-O coated conductors

被引：9

作者：

Kung, H ^{[1
]}

Foltyn, SR ^{[1
]}

Arendt, PN ^{[1
]}

Maley, MP ^{[1
]}

机构：

[1] Univ Calif Los Alamos Natl Lab, Mat Sci & Technol Div, Los Alamos, NM 87545 USA

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1999年 / 9卷 / 02期

关键词：

D O I：

10.1109/77.784864

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Transmission electron microscopy (TEM) has been applied to the microstructural investigation of YBa2 Cu-3 O7-delta (YBCO) thick films deposited on polycrystalline Ni-based metal substrates by pulsed laser deposition. The films were found to be strongly textured with c-axis oriented grains aligned perpendicular to the substrates. Despite the large average in-plane misorientation (theta similar to 14 degrees), as was estimated from selected area electron diffraction and x-ray diffraction, TEM inspection reveals colonies of submicron-sized grains with low angle (theta less than or equal to 7 degrees) tilt grain boundaries. The linkage of the colony structures may provide a continuous percolation pathway for the supercurrent transport in YBCO, which may provide the mechanism for the higher than expected critical current density J(c). Periodic arrays of grain boundary dislocations were observed, which may serve as effective flux pinners.

引用

页码：2034 / 2037

页数：4

共 10 条

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