Influence of polyethylene and carbon black morphology on void formation in conductive composite materials: A SANS study

被引:19
作者
Oakey, J
Marr, DWM [1 ]
Schwartz, KB
Wartenberg, M
机构
[1] Colorado Sch Mines, Dept Chem Engn, Golden, CO 80401 USA
[2] Raychem Corp, Menlo Park, CA 94025 USA
关键词
D O I
10.1021/ma990160z
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
The effects of carbon black filler and polyethylene matrix morphology on void formation in conductive composites have been studied by small-angle neutron scattering. Void formation was observed to occur postprocessing during polyethylene crystallization as a result of filler particle/polymer matrix interactions. Carbon black structure, concentration and polymer crystallinity were identified as critical parameters in this process that can be combined and used to predict void content in these semicrystalline composite materials.
引用
收藏
页码:5399 / 5404
页数:6
相关论文
共 23 条
[1]  
*ASTM, D384989 ASTM
[2]  
*ASTM, D241491 ASTM
[3]   CONDUCTING FILLED POLYMERS [J].
CARMONA, F .
PHYSICA A, 1989, 157 (01) :461-469
[4]   SMALL-ANGLE SCATTERING INVESTIGATIONS OF POLY(EPSILON-CAPROLACTONE) POLYCARBONATE BLENDS .1. SMALL-ANGLE NEUTRON AND X-RAY-SCATTERING STUDY OF CRYSTALLINE BLEND MORPHOLOGY [J].
CHEUNG, YW ;
STEIN, RS ;
WIGNALL, GD ;
YANG, HE .
MACROMOLECULES, 1993, 26 (20) :5365-5371
[5]   SCATTERING BY AN INHOMOGENEOUS SOLID [J].
DEBYE, P ;
BUECHE, AM .
JOURNAL OF APPLIED PHYSICS, 1949, 20 (06) :518-525
[6]   POLYSWITCH PTC DEVICES - A NEW LOW-RESISTANCE CONDUCTIVE POLYMER-BASED PTC DEVICE FOR OVERCURRENT PROTECTION [J].
DOLJACK, FA .
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1981, 4 (04) :372-378
[7]   ESTIMATION OF INCOHERENT BACKGROUNDS IN SANS STUDIES OF POLYMERS [J].
DUBNER, WS ;
SCHULTZ, JM ;
WIGNALL, GD .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1990, 23 :469-475
[8]   MEASUREMENT AND INTERPRETATION OF NONUNIVERSAL CRITICAL EXPONENTS IN DISORDERED CONDUCTOR-INSULATOR COMPOSITES [J].
HEANEY, MB .
PHYSICAL REVIEW B, 1995, 52 (17) :12477-12480
[9]  
Kida N, 1996, J APPL POLYM SCI, V61, P1345, DOI 10.1002/(SICI)1097-4628(19960822)61:8<1345::AID-APP15>3.0.CO
[10]  
2-Y