Off-axis reflection zone plate for quantitative soft x-ray source characterization

被引：50

作者：

Wilhein, T ^{[1
]}

Hambach, D ^{[1
]}

Niemann, B ^{[1
]}

Berglund, M ^{[1
]}

Rymell, L ^{[1
]}

Hertz, HM ^{[1
]}

机构：

[1] LUND INST TECHNOL,DEPT PHYS,S-22100 LUND,SWEDEN

来源：

APPLIED PHYSICS LETTERS | 1997年 / 71卷 / 02期

关键词：

D O I：

10.1063/1.119497

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate lambda/Delta lambda greater than or equal to 1000 spectral resolution and absolute flux and brilliance measurements. (C) 1997 American Institute of Physics.

引用

页码：190 / 192

页数：3

共 13 条

[1] Ultraviolet prepulse for enhanced x-ray emission and brightness from droplet-target laser plasmas [J].