Removing aperture-induced artifacts from Fourier transform infrared intensity values

被引:63
作者
Johnson, TJ
Sams, RL
Blake, TA
Sharpe, SW
Chu, PM
机构
[1] Pacific NW Natl Lab, Richland, WA 99352 USA
[2] Natl Inst Stand & Technol, Div Analyt Chem, Gaithersburg, MD 20899 USA
关键词
D O I
10.1364/AO.41.002831
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Two Fourier transform infrared intensity artifacts have been observed at moderately high (0.1 cm(-1)) spectral resolution: Light reflected off the aperture was double modulated by the interferometer, producing a 2f alias, and the warm (approximate to310 K) annulus of the aperture seen by a cooled detector resulted in distorted line shapes and anomalous intensities in the fingerprint region. Although the second artifact has been alluded to previously, we report corrections to remove both of these anomalies and to demonstrate the efficacy of these corrections. Prior to correction, integrated-band intensities were found to be in error by up to 12%. (C) 2002 Optical Society of America.
引用
收藏
页码:2831 / 2839
页数:9
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