Estimation of the reconstruction parameters for atom probe tomography

被引:141
作者
Gault, Baptiste [1 ]
de Geuser, Frederic [2 ]
Stephenson, Leigh T. [1 ]
Moody, Michael P. [1 ]
Muddle, Barrington C. [2 ]
Ringer, Simon P. [1 ]
机构
[1] Univ Sydney, Australian Key Ctr Microscopy & Microanal, Sydney, NSW 2006, Australia
[2] Monash Univ, ARC Ctr Excellence Design Light Met, Dept Mat Engn, Clayton, Vic 3800, Australia
关键词
atom probe tomography (APT); three-dimensional reconstruction; Fourier analysis; field desorption microscopy; data analysis; spatial resolution;
D O I
10.1017/S1431927608080690
中图分类号
T [工业技术];
学科分类号
08 [工学];
摘要
The application of wide field-of-view detection systems to atom probe experiments emphasizes the importance of careful parameter selection in the tomographic reconstruction of the analyzed volume, as the sensitivity to errors rises steeply with increases in analysis dimensions. In this article, a self-consistent method is presented for the systematic determination of the main reconstruction parameters. In the proposed approach, the compression factor and the field factor are determined using geometrical projections from the desorption images. A three-dimensional Fourier transform is then applied to a series of reconstructions, and after comparing to the known material crystallography, the efficiency of the detector is estimated. The final results demonstrate a significant improvement in the accuracy of the reconstructed volumes.
引用
收藏
页码:296 / 305
页数:10
相关论文
共 47 条
[1]
[Anonymous], 1961, FIELD EMISSION FIELD
[2]
A GENERAL PROTOCOL FOR THE RECONSTRUCTION OF 3D ATOM-PROBE DATA [J].
BAS, P ;
BOSTEL, A ;
DECONIHOUT, B ;
BLAVETTE, D .
APPLIED SURFACE SCIENCE, 1995, 87-8 (1-4) :298-304
[3]
Three-dimensional atomic-scale imaging of impurity segregation to line defects [J].
Blavette, D ;
Cadel, E ;
Fraczkiewicz, A ;
Menand, A .
SCIENCE, 1999, 286 (5448) :2317-2319
[4]
THE TOMOGRAPHIC ATOM-PROBE - A QUANTITATIVE 3-DIMENSIONAL NANOANALYTICAL INSTRUMENT ON AN ATOMIC-SCALE [J].
BLAVETTE, D ;
DECONIHOUT, B ;
BOSTEL, A ;
SARRAU, JM ;
BOUET, M ;
MENAND, A .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (10) :2911-2919
[5]
AN ATOM-PROBE FOR 3-DIMENSIONAL TOMOGRAPHY [J].
BLAVETTE, D ;
BOSTEL, A ;
SARRAU, JM ;
DECONIHOUT, B ;
MENAND, A .
NATURE, 1993, 363 (6428) :432-435
[6]
Brandon D. G., 1968, Field-ion microscopy, P28
[7]
ACCURATE DETERMINATION OF CRYSTAL ORIENTATION FROM FIELD ION MICROGRAPHS [J].
BRANDON, DG .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1964, 41 (06) :373-&
[8]
A METHOD FOR RECONSTRUCTING AND LOCATING ATOMS ON THE CRYSTAL-LATTICE IN 3-DIMENSIONAL ATOM-PROBE DATA [J].
CAMUS, PP ;
LARSON, DJ ;
KELLY, TF .
APPLIED SURFACE SCIENCE, 1995, 87-8 (1-4) :305-310
[9]
Some aspects of image projection in the field-ion microscope [J].
Cerezo, A ;
Warren, PJ ;
Smith, GDW .
ULTRAMICROSCOPY, 1999, 79 (1-4) :251-257
[10]
APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS [J].
CEREZO, A ;
GODFREY, TJ ;
SMITH, GDW .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (06) :862-866