Measurement of electron-beam bunch length and emittance using shot-noise-driven fluctuations in incoherent radiation

被引：35

作者：

Catravas, P

Leemans, WP

Wurtele, JS

Zolotorev, MS

Babzien, M

Ben-Zvi, I

Segalov, Z

Wang, XJ

Yakimenko, V

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Ctr Beam Phys, Berkeley, CA 94720 USA

[2] Brookhaven Natl Lab, Accelerator Test Facil, Upton, NY 11973 USA

来源：

PHYSICAL REVIEW LETTERS | 1999年 / 82卷 / 26期

关键词：

D O I：

10.1103/PhysRevLett.82.5261

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Longitudinal and transverse phase space information has been obtained from a statistical analysis of fluctuations in the radiation spectrum of an electron bunch. Uncorrelated shot noise fluctuations in longitudinal beam density result in incoherent radiation with a spectrum that consists of spikes, with width inversely proportional to the bunch length. Measurements were performed at lambda = 620 nm on a 1-5 ps long, 44 MeV bunch propagating through a wiggler. Bunch length and emittance obtained with this single shot technique agree with independent measurements.

引用

页码：5261 / 5264

页数：4

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