Remanence enhancement and exchange coupling in PrCo/Co films

被引:17
作者
Liu, JP
Liu, Y
Shan, ZS
Sellmyer, DJ
机构
[1] Center for Materials Research and Analysis, University of Nebraska, Lincoln
关键词
D O I
10.1109/20.619546
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
PrCo/Co multilayer thin films have been prepared by sputtering. After heat treatment, high coercivity is developed and the remanence is enhanced for the insertion of the Co layers and the exchange coupling between the hard phase and the soft phase, which leads to high energy products of the composite magnets. The nanostructure of the films has been studied by TEM. It is found that the grain size of the films with high energy products is in the range from 10 to 25 nanometers.
引用
收藏
页码:3709 / 3711
页数:3
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