In-situ observation of shape and atomic structure of Xe nanocrystals embedded in aluminium

An imaging technique to determine in situ the shape and atomic structure of nanosized Se crystals embedded in Al is described using high-resolution transmission electron microscopy (HRTEM). The Se nanocrystals, with sizes less than 5 nm were prepared by the implantation of 30 keV Xe+ into Al at room temperature. The fee Se nanocrystals are mesotactic with the Al lattice and have a lattice parameter approximate to 50% larger than that of Al. HRTEM images of the Se were not clear in [110] zone axis illumination because of the small number of Xe atoms relative to iii atoms in any atom column. An off-axial imaging technique that consists of tilting the specimen several degrees from a zone axis and defocusing to suppress the Al lattice fringes is employed for the 110 projection of the Xe/Al system and the structure of the Sc nanocrystals is successfully imaged. The Se images clearly represent projections of cuboctahedra with faces parallel to eight Al {111} planes truncated by six {100} planes. The results of multislice image simulations using a three-dimensional atomic model agreed well with the results obtained by the off-axial imaging technique. The usefulness of the technique is demonstrated with observations of crystal defects introduced into the Ne under intense 1000 keV electron irradiation.