Laser-induced nano-oxidation on hydrogen-passivated Ge (100) surfaces under a scanning tunneling microscope tip

被引:59
作者
Lu, YF
Mai, ZH
Qiu, G
Chim, WK
机构
[1] Natl Univ Singapore, Dept Elect Engn, Singapore 119260, Singapore
[2] Natl Univ Singapore, Data Storage Inst, Laser Microproc Lab, Singapore 119260, Singapore
关键词
D O I
10.1063/1.125014
中图分类号
O59 [应用物理学];
学科分类号
摘要
Laser-induced nano-oxidation on hydrogen-passivated Ge (100) surfaces under a scanning tunneling microscope tip in air has been investigated. A 532 nm Nd:YAG pulsed laser with a pulse duration of 7 ns was used. A 2 x 2 oxide dot array with dot sizes between 20 and 30 nm and an oxide single line with a width less than 30 nm have been created using an electrochemical-etched tungsten tip under laser irradiation. The modified regions were characterized by atomic force microscope. The apparent depth of oxide layer as a function of laser intensity has been studied. The advantages and drawbacks of using a continuous wave laser and a pulsed laser will be discussed. (C) 1999 American Institute of Physics. [S0003-6951(99)03642-6].
引用
收藏
页码:2359 / 2361
页数:3
相关论文
共 25 条
[1]   MODIFICATION OF HF-TREATED SILICON (100) SURFACES BY SCANNING TUNNELING MICROSCOPY IN AIR UNDER IMAGING CONDITIONS [J].
BARNIOL, N ;
PEREZMURANO, F ;
AYMERICH, X .
APPLIED PHYSICS LETTERS, 1992, 61 (04) :462-464
[2]   MODIFICATION OF HYDROGEN-PASSIVATED SILICON BY A SCANNING TUNNELING MICROSCOPE OPERATING IN AIR [J].
DAGATA, JA ;
SCHNEIR, J ;
HARARY, HH ;
EVANS, CJ ;
POSTEK, MT ;
BENNETT, J .
APPLIED PHYSICS LETTERS, 1990, 56 (20) :2001-2003
[3]   SELECTIVE AREA OXIDATION OF SILICON WITH A SCANNING FORCE MICROSCOPE [J].
DAY, HC ;
ALLEE, DR .
APPLIED PHYSICS LETTERS, 1993, 62 (21) :2691-2693
[4]   An X-ray photoelectron spectroscopy study of the HF etching of native oxides on Ge(111) and Ge(100) surfaces [J].
Deegan, T ;
Hughes, G .
APPLIED SURFACE SCIENCE, 1998, 123 :66-70
[5]   NEAR-FIELD OPTICS - MICROSCOPY WITH NANOMETER-SIZE FIELDS [J].
DENK, W ;
POHL, DW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :510-513
[6]  
Ehrlich D.J., 1989, LASER MICROFABRICATI
[7]  
Fillard J.P., 1996, NEAR FIELD OPTICS NA
[8]   Characterization of scanning tunneling microscopy and atomic force microscopy-based techniques for nanolithography on hydrogen-passivated silicon [J].
Fontaine, PA ;
Dubois, E ;
Stievenard, D .
JOURNAL OF APPLIED PHYSICS, 1998, 84 (04) :1776-1781
[9]   TIP SHARPENING BY NORMAL AND REVERSE ELECTROCHEMICAL ETCHING [J].
FOTINO, M .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (01) :159-167
[10]   THIN-FILM NANOPROCESSING BY LASER STM COMBINATION [J].
GORBUNOV, AA ;
POMPE, W .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1994, 145 (02) :333-338