Effect of depolarization of scattered evanescent waves on particle-trapped near-field scanning optical microscopy

被引：23

作者：

Gu, M ^{[1
]}

Ke, PC ^{[1
]}

机构：

[1] Univ Victoria, Sch Commun & Informat, Optoelect Imaging Grp, Victoria, BC 8001, Canada

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 02期

关键词：

D O I：

10.1063/1.124310

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The degree of polarization of the scattered evanescent wave is measured with a laser-trapped particle for different incident angles. It is found that depolarization under s polarized beam illumination is stronger than that under p polarized beam illumination. As a result, the contrast of the evanescent wave interference pattern imaged in a particle-trapped near-field scanning optical microscope is improved approximately by a factor of 3 with a parallel analyzer under s polarized beam illumination. The phase shift of scattered evanescent waves under s and p polarized beam illumination is determined from the measured evanescent wave interference pattern. (C) 1999 American Institute of Physics. [S0003-6951(99)03729-8].

引用

页码：175 / 177

页数：3

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