Measuring the energy of the graphite π+σ plasmon peak

被引：25

作者：

Filippi, M ^{[1
]}

Calliari, L ^{[1
]}

机构：

[1] ITC Irst, Ctr Ric Sci & Tecnol, I-38050 Trento, Italy

来源：

SURFACE AND INTERFACE ANALYSIS | 2006年 / 38卷 / 04期

关键词：

electron energy loss spectroscopy; X-ray photoelectron spectroscopy; graphite; plasmon energy;

D O I：

10.1002/sia.2221

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We examine the graphite plasmon loss structure in reflection electron energy loss spectroscopy (REELS) and XPS with respect to the issue of measuring the energy, E-p, of the pi + sigma plasmon peak. The two spectra differ in shape because they are based on different physical processes. In fact, a static core hole - leading to intrinsic (in addition to extrinsic) losses - exists only for XPS. We show that no single energy can be measured on the two spectra for the pi + sigma peak. Possible procedures to deal with the matter are considered. Copyright (C) 2006 John Wiley & Sons, Ltd.

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收藏

页码：595 / 598

页数：4

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