SIMS artifacts in the near surface depth profiling of oxygen conducting ceramics

被引：17

作者：

Fearn, Sarah ^{[1
]}

Rossiny, Jeremy ^{[1
]}

Kilner, John ^{[1
]}

机构：

[1] Univ London Imperial Coll Sci Technol & Med, Dept Mat, London SW7 2AZ, England

来源：

SOLID STATE IONICS | 2008年 / 179卷 / 21-26期

基金：

英国自然环境研究理事会;

关键词：

low energy SIMS; LSM; surface exchange coefficient; oxygen diffusion;

D O I：

10.1016/j.ssi.2008.01.020

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Using ultra low energy SIMS ion beams of oxygen and nitrogen, the very near surface region of an O-16 annealed La0.8Sr0.2MnO3 pellet has been depth profiled in order to investigate the surface layer composition and to determine any perturbing ion beam-target interactions. By ratioing the measured cation species, the results indicate that only Sr segregation at the near surface can be clearly identified, and no separate oxide layer was present on the top surface. By monitoring the build up of the altered layer associated with SIMS depth profiling, it was observed that the depth at which the altered layer was fully fon-ncd was deeper than the expected projected range, R, of the ion beam. These results confirm Sr excess in the near surface, which will have an effect on the vacancy concentration and therefore the surface exchange coefficient, k. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：811 / 815

页数：5

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