Pulse electroplating of rich-in-tungsten thin layers of amorphous Co-W alloys

被引:48
作者
Donten, M
Stojek, Z
机构
[1] Department of Chemistry, University of Warsaw, 02-093 Warsaw
关键词
Adhesion - Amorphous alloys - Cobalt - Corrosion resistance - Current density - Ductility - Hardness - Oxidation - Thin films - Tungsten - X ray diffraction;
D O I
10.1007/BF00253466
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
A combination of an improved plating bath and pulsed current was shown to lead to a substantial increase in tungsten content in amorphous Co-W alloys. This increase was associated with selective oxidation of cobalt during the rest times of the deposition process. The tungsten content reached 41.4 at % under the following conditions: current density 35mA cm(-2) ratio of pulse time to rest time 1/1, and pulse frequency 10 Hz. The alloy layers were of similar hardness and of much better smoothness, ductility, adhesion to the substrate, and resistance to corrosion compared to those plated according to the US 4529668 patent.
引用
收藏
页码:665 / 672
页数:8
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