Microwave surface resistance of YBa2Cu3Cu3O7-x films on polycrystalline ceramic substrates with textured buffer layers

被引：9

作者：

Findikoglu, AT ^{[1
]}

Foltyn, SR ^{[1
]}

Arendt, PN ^{[1
]}

Groves, JR ^{[1
]}

Jia, QX ^{[1
]}

Peterson, EJ ^{[1
]}

Wu, XD ^{[1
]}

Reagor, DW ^{[1
]}

机构：

[1] LOS ALAMOS NATL LAB,DIV MAT SCI & TECHNOL,LOS ALAMOS,NM 87545

来源：

APPLIED PHYSICS LETTERS | 1996年 / 69卷 / 11期

关键词：

D O I：

10.1063/1.117052

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have used a parallel-plate resonator technique to measure the microwave surface resistance R(s) of YBa2Cu3O7-x (YBCO) films on buffered ceramic substrates at around 10 GHz, and studied the correlation between their R(s) and materials properties. A 0.4-mu m-thick YBCO film (with an in-plane mosaic spread of 7 degrees) grown on a polycrystalline alumina substrate with an ion-beam-assisted-deposited yttria-stabilized zirconia buffer layer showed an R(s) of 1.89 m Omega at 76 K and 0.21 m Omega at 4 K. We have observed a strong correlation between the R(s) of the samples and the in-plane mosaic spread of the YBCO films. This correlation can be explained qualitatively in terms of a simple model in which the weak links between the grains of the YBCO film form an electrical network of Josephson junctions.

引用

页码：1626 / 1628

页数：3

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