Spectral microphotoluminescence investigation of impurity-defect interaction in CdTe with high spatial resolution

被引：4

作者：

Gukasyan, A ^{[1
]}

Kvit, A ^{[1
]}

Klevkov, Y ^{[1
]}

Kazaryan, S ^{[1
]}

机构：

[1] PN LEBEDEV PHYS INST,MOSCOW 117924,RUSSIA

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1997年 / 47卷 / 01期

关键词：

microphotoluminescence; polycrystalline CdTe; spatial resolution;

D O I：

10.1016/S0921-5107(96)02040-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The microphotoluminescence (MPL) technique is applied to investigate the behavior of residual impurities in the nearest vicinity of extended defects in polycrystalline CdTe. The MPL spectra variation is associated with impurity-defect interaction and their complex formation. The high purity of CdTe samples used in experiments helped to separate the influence of residual impurities, native defects and their complexes on MPL properties of the material. (C) 1997 Elsevier Science S.A.

引用

页码：87 / 89

页数：3

共 7 条

[1] SPATIAL ORIGIN OF VARIOUS PL LINES IN CDTE AT 77-K [J].