Automatic Defect Detection on Hot-Rolled Flat Steel Products

被引:366
作者
Ghorai, Santanu [1 ]
Mukherjee, Anirban [2 ]
Gangadaran, M. [3 ]
Dutta, Pranab K. [2 ,4 ]
机构
[1] Heritage Inst Technol, Dept Appl Elect & Instrumentat Engn, Kolkata 700107, India
[2] Indian Inst Technol Kharagpur, Dept Elect Engn, Kharagpur 721302, W Bengal, India
[3] Steel Author India Ltd, Appropriate Automat Promot Ctr Grp, Res & Dev Iron & Steel, Ranchi 834002, Bihar, India
[4] Indian Inst Technol Kharagpur, Sch Med Sci & Technol, Kharagpur 721302, W Bengal, India
关键词
Automated visual inspection system; defect detection; discrete wavelet transform (DWT); kernel classifier; support vector machine (SVM); INSPECTION; SURFACE; SYSTEM;
D O I
10.1109/TIM.2012.2218677
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
080906 [电磁信息功能材料与结构]; 082806 [农业信息与电气工程];
摘要
Automatic defect detection on hot-rolled steel surface is challenging owing to its localization on a large surface, variation in appearance, and their rare occurrences. It is difficult to detect these defects either by physics-based models or by small-sample statistics using a single threshold. As a result, this problem is focused to derive a set of good-quality defect descriptors from the surface images. These descriptors should discriminate the various surface defects when fed to suitable machine learning algorithms. This research work has evaluated the performance of a number of different wavelet feature sets, namely, Haar, Daubechies 2 (DB2), Daubechies 4 (DB4), biorthogonal spline, and multiwavelet in different decomposition levels derived from 32 x 32 contiguous (nonoverlapping) pixel blocks of steel surface images. We have developed an automated visual inspection system for an integrated steel plant to capture surface images in real time. It localizes defects employing kernel classifiers, such as support vector machine and recently proposed vector-valued regularized kernel function approximation. Test results on 1000 defect-free and 432 defective images comprising of 24 types of defect classes reveal that three-level Haar feature set is more promising to address this problem than the other wavelet feature sets as well as texture-based segmentation or thresholding technique of defect detection.
引用
收藏
页码:612 / 621
页数:10
相关论文
共 25 条
[1]
[Anonymous], 2004, KERNEL METHODS PATTE
[2]
Adaptive surface inspection via interactive evolution [J].
Caleb-Solly, P. ;
Smith, J. E. .
IMAGE AND VISION COMPUTING, 2007, 25 (07) :1058-1072
[3]
LIBSVM: A Library for Support Vector Machines [J].
Chang, Chih-Chung ;
Lin, Chih-Jen .
ACM TRANSACTIONS ON INTELLIGENT SYSTEMS AND TECHNOLOGY, 2011, 2 (03)
[4]
An anisotropic diffusion-based defect detection for low-contrast glass substrates [J].
Chao, Shin-Min ;
Tsai, Du-Ming .
IMAGE AND VISION COMPUTING, 2008, 26 (02) :187-200
[5]
Cherkassky V, 1997, IEEE Trans Neural Netw, V8, P1564, DOI 10.1109/TNN.1997.641482
[6]
Choi SH, 2007, PROC WRLD ACAD SCI E, V19, P66
[7]
Cristianini Nello, 2000, An Introduction to Support Vector Machines and Other Kernel-Based Learning Methods, DOI DOI 10.1017/CB09780511801389
[8]
Discriminant Analysis for Fast Multiclass Data Classification Through Regularized Kernel Function Approximation [J].
Ghorai, Santanu ;
Mukherjee, Anirban ;
Dutta, Pranab K. .
IEEE TRANSACTIONS ON NEURAL NETWORKS, 2010, 21 (06) :1020-1029
[9]
Gonzalez R. C., 1993, DIGITAL IMAGE PROCES
[10]
Neural network based detection of local textile defects [J].
Kumar, A .
PATTERN RECOGNITION, 2003, 36 (07) :1645-1659