Effects of two-dimensional and finite density fluctuations on O-X correlation reflectometry

被引:14
作者
Kramer, GJ [1 ]
Nazikian, R [1 ]
Valeo, E [1 ]
机构
[1] Princeton Plasma Phys Lab, Princeton, NJ 08543 USA
关键词
D O I
10.1088/0741-3335/44/2/102
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
The correlation between O- and X-mode reflectometer signals is studied with a one- and two-dimensional reflectometer model in order to explore its feasibilities as a q-profile diagnostic. it was found that two-dimensional effects and finite fluctuation levels both decrease the O-X correlation, At very low fluctuation levels, which are usually present in the plasma core, there is a good possibility of determining the local magnetic field strength and use that as a constraint for the equilibrium reconstruction.
引用
收藏
页码:L11 / L19
页数:9
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