A genetic algorithm for the evaluation of material parameters of compound multilayered structures

被引:36
作者
Zwick, T [1 ]
Haala, J [1 ]
Wiesbeck, W [1 ]
机构
[1] Univ Karlsruhe, Inst Hochstfrequenztech & Elektron, D-76128 Karlsruhe, Germany
关键词
genetic algorithm; material parameter extraction; multilayered structure;
D O I
10.1109/22.993422
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 [电气工程]; 0809 [电子科学与技术];
摘要
This paper presents a new method to obtain the material parameters of each single layer in a multilayered structure. The compound structure has to be measured over frequency or for different incidence angles in the microwave frequency range. The genetic algorithm for parameter extraction from the reflection or transmission measurement data is based on a simplified evolution strategy. In this paper, the evolution optimization is described briefly and is verified by measurements performed in the frequency range from 115 to 145 GHz. The parameters obtained by the algorithm show good agreement with reference values gained by other researchers.
引用
收藏
页码:1180 / 1187
页数:8
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