Reflection of a Gaussian beam from a saturable absorber

被引：21

作者：

Petrov, DV ^{[1
]}

Gomes, ASL ^{[1
]}

deAraujo, CB ^{[1
]}

机构：

[1] RUSSIAN ACAD SCI,INST SEMICOND PHYS,NOVOSIBIRSK 630090,RUSSIA

来源：

OPTICS COMMUNICATIONS | 1996年 / 123卷 / 4-6期

关键词：

D O I：

10.1016/0030-4018(95)00593-5

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The modification of a Gaussian beam profile caused by the electronic contribution to the surface nonlinear absorption of a semiconductor doped glass was measured. The reflection Z-scan and transmission Z-scan techniques used allow to observe differences between the bulk and the surface nonlinear properties.

引用

页码：637 / 641

页数：5

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