Information obtained from the surface profile of a cut single-mode fiber

被引:5
作者
Poumellec, B
Guénot, P
Nadjo, R
Keita, B
Nicolardot, M
机构
[1] Univ Paris 11, CNRS URA 446, F-91405 Orsay, France
[2] Alcatel Fibers, F-95874 Bezons, France
[3] Univ Paris Sud, CNRS URA 1383, F-91405 Orsay, France
关键词
atomic force microscopy (AMP); cutting; finite element calculation; PACS : 42.81 (optical fibers); profilometry; relaxation profile; silica; stress;
D O I
10.1109/50.779157
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper investigated the fiber-end surface modulation by atomic force microscopy (AFM) and optical profilometry after a careful cross cleavage with a diamond. The image of the surface allows to see the different parts of the fiber. The cladding appears above the mean level whereas the core appears depressed. This profile is tightly connected to the stress profile, itself induced by the doping field and the drawing conditions. Magnification of the core shows fluctuations of the glass structure at the scale of 25 nm with some of approximate to 80 nm, This method seems to be suitable to study fiber defects but is still difficult to perform due to the small size of the sample (phi = 125 mu m) and the dependence of the surface profile with the care to cleave the fiber, However, due to the better spatial resolution of the AFM measurements compared to the optical profilometry, itself larger than the one of photoelasticity measurements, it was possible to conclude that the axial stress exhibits a discontinuity at the core-cladding interface and not a peak at the center of the core.
引用
收藏
页码:1357 / 1365
页数:9
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