A 0.13-μm SOICMOS technology for low-power digital and RF applications

被引:44
作者
Zamdmer, N [1 ]
Ray, A [1 ]
Plouchart, JO [1 ]
Wagner, L [1 ]
Fong, N [1 ]
Jenkins, KA [1 ]
Jin, W [1 ]
Smeys, P [1 ]
Yang, I [1 ]
Shahidi, G [1 ]
Assaderaghi, F [1 ]
机构
[1] IBM Corp, SRDC, Hopewell Jct, NY 12533 USA
来源
2001 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS | 2001年
关键词
D O I
10.1109/VLSIT.2001.934959
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Battery-operated electronic devices that can communicate wirelessly will become more and more pervasive. This trend will be enabled by technologies that allow low-power digital and RE processing. We present here a 0.13-mum, partially-depleted SOI CMOS technology with optimized power-saving and RF properties (see Table 1 for a list of specifications). Power-saving features include low-Vt, thin-gate-oxide FETs for minimum power dissipation and high performance at low voltage (25 ps inverter delay at 0.7 V Vdd): high-Vt, thick-gate-oxide FETs for low-standby-power SRAM and logic-block power switches; and eight levels of Cu interconnects with low-k ILD Ill. RE features include high peak NFET performance (141 GHz f(T) and 98 GHz f(max) at Vds = 1.2 V) and the following group of high-Q passives: inductor (peak simulated differential Q of 50 at 4 GHz, L = 0.65 nH), MOS varactor, MIMCAP, and resistors.
引用
收藏
页码:85 / 86
页数:2
相关论文
共 6 条
[1]  
Buss D., 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318), P423, DOI 10.1109/IEDM.1999.824184
[2]  
Mahnkopf R., 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318), P849, DOI 10.1109/IEDM.1999.824282
[3]   A 140 GHz ft and 60 GHz fmax DTMOS integrated with high-performance SOI logic technology [J].
Momiyama, Y ;
Hirose, T ;
Kurata, H ;
Goto, K ;
Watanabe, Y ;
Sugii, T .
INTERNATIONAL ELECTRON DEVICES MEETING 2000, TECHNICAL DIGEST, 2000, :451-454
[4]   A high performance 0.13μm SOICMOS technology with Cu interconnects and low-k BEOL dielectric [J].
Smeys, P ;
McGahay, V ;
Yang, I ;
Adkisson, J ;
Beyer, K ;
Bula, O ;
Chen, Z ;
Chu, B ;
Culp, J ;
Das, S ;
Eckert, A ;
Hadel, L ;
Hargrove, M ;
Herman, J ;
Lin, L ;
Mann, R ;
Maciejewski, E ;
Narasimha, S ;
O'Neill, P ;
Rauch, S ;
Ryan, D ;
Toomey, J ;
Tsou, L ;
Varekamp, P ;
Wachnik, R ;
Wagner, T ;
Wu, S ;
Yu, C ;
Agnello, P ;
Connolly, J ;
Crowder, S ;
Davis, C ;
Ferguson, R ;
Sekiguchi, A ;
Su, L ;
Goldblatt, R ;
Chen, TC .
2000 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS, 2000, :184-185
[5]  
WANN C, 2000, VLSI TECH S, P999
[6]  
Wu C. C., 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318), P671, DOI 10.1109/IEDM.1999.824241