Rietveld refinements on laboratory energy dispersive X-ray diffraction (EDXD) data

被引：73

作者：

Ballirano, P

Caminiti, R

机构：

[1] Univ Roma La Sapienza, Dipartimento Sci Terra, I-00185 Rome, Italy

[2] Univ Roma La Sapienza, Ist Nazl Fis Mat, Dipartimento Chim, I-00185 Rome, Italy

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2001年 / 34卷

关键词：

D O I：

10.1107/S0021889801014728

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Rietveld refinements of corundum, a rutile and anatase nanocrystalline synthetic mixture, and gypsum, on laboratory energy dispersive X-ray diffraction (EDXD) data are reported. Cell parameters, positional and displacement parameters are in reasonable agreement with single-crystal reference data, despite the rather poor resolution of EDXD data. In particular, good results were obtained for gypsum (unrestrained refinement) with counting times as short as 1000 s.

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页码：757 / 762

页数：6

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