Magnetoresistance, micromagnetism, and domain-wall scattering in epitaxial hcp Co films

被引:96
作者
Rüdiger, U
Yu, J
Thomas, L
Parkin, SSP
Kent, AD
机构
[1] NYU, Dept Phys, New York, NY 10003 USA
[2] NYU, Dept Phys, New York, NY 10003 USA
[3] IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA
关键词
D O I
10.1103/PhysRevB.59.11914
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Large negative magnetoresistance (MR) observed in transport measurements of hcp Co films with stripe domains were recently reported and interpreted in terms of domain-wall (DW) scattering mechanism. Here detailed MR measurements, magnetic force microscopy, and micromagnetic calculations are combined to elucidate the origin of MR in this material. The large negative room-temperature MR reported previously is shown to be due to ferromagnetic resistivity anisotropy. Measurements of the resistivity for currents parallel (CIW) and perpendicular to DW's (CPW) have been conducted as a function of temperature. Low-temperature results show that any intrinsic effect of DW's scattering on MR of this material is very small compared to the anisotropic MR. [S0163-1829(99)01218-7].
引用
收藏
页码:11914 / 11918
页数:5
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