Fluctuational electromagnetic interaction of the tip of a scanning microscope with the surface of a solid

被引：6

作者：

Dedkov, GV ^{[1
]}

Kyasov, AA ^{[1
]}

机构：

[1] Kabardino Balkar State Univ, Nalchik, Russia

来源：

TECHNICAL PHYSICS LETTERS | 1999年 / 25卷 / 06期

关键词：

D O I：

10.1134/1.1262518

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A general formula for the lateral frictional force acting on the tip of a scanning microscope moving parallel to a surface with a velocity V is obtained within fluctuational electromagnetic theory. The contributions of various polarization mechanisms to this force are analyzed. The dependences of the lateral forces on the velocity, radius of curvature, and distance of the tip from the surface, as well as the temperature and the dielectric properties of the tribological contact are obtained. It is shown for the first time that the lateral forces can change sign and become accelerating for a definite combination of dielectric functions of the tip and the surface. (C) 1999 American Institute of Physics. [S1063-7850(99)01806-6].

引用

页码：466 / 468

页数：3

共 13 条

[1] Fullerene nanotubes can be used when transporting gamma-quanta, neutrons, ion beams and radiation from relativistic particles [J].