High-resolution electron microscopy and convergent-beam electron diffraction of sintered undoped hydroxyapatite

被引:25
作者
Kleebe, HJ
Bres, EF
BernacheAssolant, D
Ziegler, G
机构
[1] MAX PLANCK INST MET RES,D-70174 STUTTGART,GERMANY
[2] UNIV LILLE 3,MET PHYS LAB,LSPES URA CNRS 234,F-59650 VILLENEUVE DASCQ,FRANCE
[3] UNIV LIMOGES,LAB CERAM NOUVELLES,F-87060 LIMOGES,FRANCE
关键词
D O I
10.1111/j.1151-2916.1997.tb02788.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Transmission electron microscopy (TEM) was used to characterize the microstructure of sintered undoped hydroxyapatite (OHAp), Conventional TEM observations were accompanied by high-resolution electron microscopy (HREM) and convergent-beam electron diffraction (CBED) studies. CBED analysis enabled the determination of the space group of the OHAp, P6(3)/m. Densification of the material was performed by pressureless sintering at 1250 degrees C for 30 min. The undoped sample was comprised of apatite as the only crystalline phase, in addition to a small volume fraction (4%) of closed porosity. In general, the observed microstructure was homogeneous and consisted of equiaxed apatite grains with an average grain diameter of similar to 1-2 mu m No indication of a residual amorphous phase, which may have formed during sintering, was observed at multigrain junctions. HREM studies on grain boundaries also revealed that no intergranular glass film was present along two-grain junctions, indicating that densification proceeded without a liquid phase. A slightly disordered region at the interfaces was observed, suggesting an extended grain-boundary structure.
引用
收藏
页码:37 / 44
页数:8
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