Electroless nickel bumping of aluminum bondpads - Part II: Electroless nickel plating

被引:15
作者
Hutt, DA [1 ]
Liu, CQ
Conway, PP
Whalley, DC
Mannan, SH
机构
[1] Loughborough Univ Technol, Wolfson Sch Mech & Mfg Engn, Loughborough LE11 3TU, Leics, England
[2] Kings Coll London, Dept Mech Engn, London WC2R 2LS, England
来源
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 2002年 / 25卷 / 01期
基金
英国工程与自然科学研究理事会;
关键词
electroless nickel; flip-chip; under bump metallization (UBM); wafer bumping; zincate;
D O I
10.1109/6144.991181
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electroless nickel has been used for many decades to provide a hard, corrosion resistant surface finish to engineering components. In recent years its application has been extended to the electronics industry for the production of solderable surfaces on printed circuit boards, which utilize a further thin gold coating to prevent oxidation of the nickel surface. The recent interest in the use of flip-chip technology in electronics manufacture has required the development of low cost methods for solder bumping of semiconductor wafers. The electroless nickel process has been considered as a suitable candidate for the deposition of a solderable under bump metallization (UBM) layer onto the Al bondpads. However, the extension of existing electroless nickel plating processes to this new application requires greater understanding of the technique. In particular, the coating of the small isolated bondpads on the wafer surface introduces difficulties that make the use of many commercially available solutions impossible. This paper reports the results of a number of experiments carried out to investigate the electroless nickel bumping of Al bondpads and highlights the issues that need to be considered when selecting materials and techniques.
引用
收藏
页码:98 / 105
页数:8
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