Near-field second-harmonic imaging of ferromagnetic and ferroelectric materials

被引：46

作者：

Smolyaninov, II

Zayats, AV

Davis, CC

机构：

[1] Department of Electrical Engineering, University of Maryland, College Park

来源：

OPTICS LETTERS | 1997年 / 22卷 / 21期

关键词：

D O I：

10.1364/OL.22.001592

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A novel scanning probe technique that is able to image surface magnetic and electric properties has been developed. It is based on the near-field microscopy of surface second-harmonic generation. We have demonstrated the capability of the technique by imaging the domain structure of a Ni single crystal and a piezoelectric ceramic. (C) 1997 Optical Society of America.

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页码：1592 / 1594

页数：3

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