Ion mobility spectrometry: Arriving on site and moving beyond a low profile

被引：182

作者：

Baumbach, JI

Eiceman, GA

机构：

[1] Inst Spektrochem & Angew Spekt, D-44139 Dortmund, Germany

[2] New Mexico State Univ, Dept Chem & Biochem, Las Cruces, NM 88003 USA

来源：

APPLIED SPECTROSCOPY | 1999年 / 53卷 / 09期

关键词：

D O I：

10.1366/0003702991947847

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A review is carried out to highlight proven or promising advances in ion mobility spectrometry (IMS) for prospective users, particularly those in industry. The remarkable transformation and uses of IMS for on-site or in-field measurements are demonstrated through the example of the chemical agent monitor or CAM. In addition, an updated primer on IMS is also given.

引用

页码：338A / 355A

页数：18

共 105 条

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