Theory of resonant SNOM (scanning near-field optical microscopy): Breakdown of the electric dipole selection rule in the reflection mode

被引:24
作者
Cho, KK
Ohfuti, Y
Arima, K
机构
[1] Faculty of Engineering Science, Osaka University, 560 Toyonaka
关键词
dipole selection rule; scanning near-field optical microscopy;
D O I
10.1016/0039-6028(96)00164-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A theoretical study is reported about SNOM with the use of light in resonance with the quantized levels of a mesoscopic sample. The microscopic variation of electromagnetic field and the coherence of matter state are properly treated by solving the microscopic Maxwell equations and Schrodinger equation self consistently. A remarkable effect, i.e., the breakdown of the dipole selection rule, is shown in the reflection mode where a probe tip is used for both illumination of the sample and collection of the signal. Namely, both dipole-active and higher-multipole-active levels give comparable signal intensities for appropriate probe tip positions.
引用
收藏
页码:378 / 384
页数:7
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