Effect of humidity on the hysteresis of single walled carbon nanotube field-effect transistors

被引:38
作者
Rinkio, Marcus [1 ]
Zavodchikova, Marina Y. [2 ,3 ]
Torma, Paivi [4 ]
Johansson, Andreas [1 ]
机构
[1] Univ Jyvaskyla, Nanosci Ctr, Dept Phys, Jyvaskyla 40014, Finland
[2] Aalto Univ, Phys Lab, Espoo 02015, Finland
[3] Aalto Univ, Ctr New Mat, Espoo 02015, Finland
[4] Aalto Univ, Dept Engn Phys, Espoo 02015, Finland
来源
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2008年 / 245卷 / 10期
基金
芬兰科学院;
关键词
D O I
10.1002/pssb.200879596
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Single walled carbon nanotube field-effect transistors (SWCNT FETs) are attributed as possible building blocks for future molecular electronics. But often these transistors seem to randomly display hysteresis in their transfer characteristics. One reason for this is suggested to be water molecules adsorbed to the surface of the gate dielectric. In this study we investigate the hysteresis of SWCNT FETs at different relative humidities. We find that SWCNT FETs having atomic layer deposited (ALD) HfO2 - TiO2 - HfO2 as a gate dielectric retain their ambient condition hysteresis better in dry N-2 environment than the more commonly used SiO2 gate oxide. (C) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:2315 / 2318
页数:4
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