Supercritical CO2 fluid for chip resistor cleaning

被引:21
作者
Wang, CW [1 ]
Chang, RT
Lin, WK
Lin, RD
Liang, MT
Yang, JF
Wang, JB
机构
[1] I Shou Univ, Dept Elect Engn, Kaohsiung, Taiwan
[2] I Shou Univ, Dept Chem Engn, Kaohsiung, Taiwan
[3] Philips Components, Tech Dept, RSMD BU, Kaohsiung, Taiwan
关键词
D O I
10.1149/1.1392501
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The cleaning ability of supercritical CO2 was examined on chip resistors. Extraction analyses were made by atomic absorption spectroscopy and the extent of surface cleaning observed by scanning electron microscopy. Experimental results showed that the flow-cleaning process of supercritical CO2 possessed the advantages of having a superior cleaning ability and permitting a nondrying step. These characteristics strongly suggest that supercritical CO2 is a superior alternative to the traditional deionized water used in rinsing chip resistors. Moreover, a higher pressure and temperature can benefit the cleaning ability of this novel supercritical CO2 cleaning technique. (C) 1999 The Electrochemical Society. S0013-4651(98)11-094-7. All rights reserved.
引用
收藏
页码:3485 / 3488
页数:4
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