Polarized resonant inelastic x-ray scattering as an ultrafine probe of excited states of La2CuO4

被引：32

作者：

Shukla, A

Calandra, M

Taguchi, M

Kotani, A

Vankó, G

Cheong, SW

机构：

[1] Inst Mineral & Phys Milieux Condensees, F-75252 Paris 05, France

[2] RIKEN, SPring 8, Soft Xray Spect Lab, Sayo, Hyogo 6795148, Japan

[3] High Energy Accelerator Res Org, IMSS, Photon Factory, Tsukuba, Ibaraki 3050801, Japan

[4] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[5] Rutgers State Univ, Dept Phys & Astron, Piscataway, NJ 08854 USA

来源：

PHYSICAL REVIEW LETTERS | 2006年 / 96卷 / 07期

关键词：

D O I：

10.1103/PhysRevLett.96.077006

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

X-ray absorption is the standard method to probe the unoccupied density of states at a given edge. Here we show that polarized resonant inelastic x-ray scattering in La2CuO4 at the Cu K edge is extremely sensitive to the environment of the Cu atom and the fine structure in the Cu 4p density of states. Combined ab initio and many-body cluster calculations, used for the first time in such a context, show remarkable agreement with experiment. In particular, we identify a nonlocal effect, namely, a transition to off-site Cu 3d states.

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页数：4

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