Imaging of surface potential distribution in cyanine dye monolayer by scanning Maxwell stress microscopy (SMM)

被引：8

作者：

Hirata, Y ^{[1
]}

Inoue, T ^{[1
]}

Mizutani, F ^{[1
]}

Katsura, T ^{[1
]}

Yokoyama, H ^{[1
]}

机构：

[1] ELECTROTECH LAB,TSUKUBA,IBARAKI 305,JAPAN

来源：

MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 1997年 / 294卷

关键词：

D O I：

10.1080/10587259708032247

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Scanning Maxwell stress Microscopy (SMM), which is a type of scanning probe microscopy designed to image microscopic electrical properties, has been applied to cyanine dye Langmuir-Blodgett (LB) monolayers. In combination of epifluorescence microscope technique with SMM, the cyanine J-aggregate formation way was clearly observed. Further the light induced electron transfer between cyanine and viologen in LB film system could be detected as a surface potential change by SMM technique.

引用

页码：55 / &

页数：6

共 5 条

[1]

HIRATA Y, IN PRESS J ELECTROAN

[2] IMAGING OF SURFACE ELECTROSTATIC FEATURES IN PHASE-SEPARATED PHOSPHOLIPID MONOLAYERS BY SCANNING MAXWELL STRESS MICROSCOPY [J].