Measurement of contact line tension by analysis of the three-phase boundary with nanometer resolution

被引：26

作者：

Pompe, T

Fery, A

Herminghaus, S

机构：

[1] Univ Ulm, Abt Angew Phys, D-89081 Ulm, Germany

[2] MPI Kolloide & Grenzflachen, D-14424 Potsdam, Germany

来源：

JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY | 1999年 / 13卷 / 10期

关键词：

contact line tension; scanning force microscopy; modified Young equation;

D O I：

10.1163/156856199X00848

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

Liquid structures on solid substrates have been imaged with a resolution in the nanometer range by scanning force microscopy in the tapping mode. Using substrates with an artificially patterned wettability, characteristic features in the three-phase contact line were induced, which allow the contact line tension to be determined. The values in the range of -1 x 10(-10) N obtained for sessile droplets of hexaethylene glycol are consistent with theoretical predictions.

引用

页码：1155 / 1164

页数：10

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