The XAFS beamline BL01B1 at SPring-8

被引：115

作者：

Uruga, T ^{[1
]}

Tanida, H

Yoneda, Y

Takeshita, K

Emura, S

Takahashi, M

Harada, M

Nishihata, Y

Kubozono, Y

Tanaka, T

Yamamoto, T

Maeda, H

Kamishima, O

Takabayashi, Y

Nakata, Y

Kimura, H

Goto, S

Ishikawa, T

机构：

[1] SPring 8, JASRI, Hyougo 6795198, Japan

[2] SPring 8, RIKEN, Hyougo 6795198, Japan

[3] SPring 8, JAERI Kansal, Hyougo 6795143, Japan

[4] Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan

[5] Okayama Univ, Fac Sci, Okayama 700, Japan

[6] Kyoto Univ, Dept Mol Engn, Kyoto 6065801, Japan

[7] Osaka Univ, Fac Sci, Osaka 560, Japan

[8] NEC Corp Ltd, Fundamental Res Lab, Tsukuba, Ibaraki 305, Japan

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1999年 / 6卷

关键词：

XAFS; high-energy; beamlines;

D O I：

10.1107/S0909049598016173

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An x-ray absorption fine-structure (XAFS) spectroscopy beamline, BL01B1, was installed at a bending magnet source at SPring-8 and has been open to users since October 1997. It was designed for XAFS experiments covering a wide energy range. Position tables and automatical control programs were established to adjust the x-ray optics and achieve the designed performance of the beamline under each experimental condition. This has enabled conventional XAFS measurements to be made with a good data quality from 4.5 to 110 keV.

引用

页码：143 / 145

页数：3

共 5 条

[1]

EMURA S, 1995, SPRING 8 ANN REPORT, P67

[2] Standard transport channels of X-ray beamlines at SPring-8 [J].

Goto, S ;

Yabashi, M ;

Ohashi, H ;

Kimura, H ;

Takeshita, K ;

Uruga, T ;

Mochizuki, T ;

Kohmura, Y ;

Kuroda, M ;

Yamamoto, M ;

Furukawa, Y ;

Kamiya, N ;

Ishikawa, T .

JOURNAL OF SYNCHROTRON RADIATION, 1998, 5 :1202-1205

[3]

TANAK T, 1998, SPECTRA SYNCHROTRON

[4]

TANASE J, 1997, JPSE P 2 US JAP WORK, P479

[5] X-RAY OPTICS RESEARCH-AND-DEVELOPMENT FOR SPRING-8 BEAMLINES [J].

URUGA, T ;

KIMURA, H ;

KOHMURA, Y ;

KURODA, M ;

NAGASAWA, H ;

OHTOMO, K ;

YAMAOKA, H ;

ISHIKAWA, T ;

UEKI, T ;

IWASAKI, H ;

HASHIMOTO, S ;

KASHIHARA, Y ;

OKUI, K .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02) :2254-2256

← 1 →