WinPLOTR:: A Windows tool for powder diffraction pattern analysis

被引：2182

作者：

Roisnel, T ^{[1
]}

Rodríguez-Carvajal, J

机构：

[1] CEA Saclay, CNRS, CEA, Lab Leon Brillouin, FR-91191 Gif Sur Yvette, France

[2] Univ Rennes 1, Chim Solide & Inorgan Mol Lab, CNRS, UMR 6511, FR-35042 Rennes, France

来源：

EPDIC 7: EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2 | 2001年 / 378-3卷

关键词：

diffraction pattern analysis; Graphical User Interface; Rietveld refinement; WinPLOTR;

D O I：

10.4028/www.scientific.net/MSF.378-381.118

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

WinPLOTR is a graphic program for the analysis of powder diffraction patterns. It has been developed for a Windows 9x/2k/NT environment. It takes advantage of this graphical environment to offer a powerful and user-friendly powder diffraction tool. The program is able to display and analyse many different kinds of diffraction patterns as well as calculated and observed profiles coming from the Windows/DOS version of the program FullProf. It can also be used as a Graphic User Interface (GUI) for programs defined by the user.

引用

页码：118 / 123

页数：6

共 9 条

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