Magnetic microscopies: the new additions

被引：19

作者：

Dahlberg, ED ^{[1
]}

Proksch, R

机构：

[1] Univ Minnesota, Sch Phys & Astron, Magnet Microscopy Ctr, Minneapolis, MN 55455 USA

[2] Digital Instruments, Santa Barbara, CA 93106 USA

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1999年 / 200卷 / 1-3期

关键词：

magnetic force microscopy; electron holography; scanning electron microscopy; polarization analysis; SQUID; Kerr microscopy;

D O I：

10.1016/S0304-8853(99)00405-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The strengths and weaknesses of many of the newer magnetic microscopies are reviewed. These include magnetic force microscopy, electron holography, scanning electron microscopy with polarization analysis, and scanning SQUID microscopy. Because of relatively recent improvements, magneto-optic microscopy is also included. In addition to the discussion, an example of an image using each of the microscopics is included. (C) 1999 Published by Elsevier Science B.V. All rights reserved.

引用

页码：720 / 728

页数：9

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