A model accounting for spatial overlaps in 3D atom-probe microscopy

被引：102

作者：

Blavette, D ^{[1
]}

Vurpillot, F ^{[1
]}

Pareige, P ^{[1
]}

Menand, A ^{[1
]}

机构：

[1] Univ Rouen, UFR Sci, CNRS, UMR 6634,Grp Mat Phys, F-76821 Mont St Aignan, France

来源：

ULTRAMICROSCOPY | 2001年 / 89卷 / 1-3期

关键词：

atom probe; phase composition; local magnification; modelling;

D O I：

10.1016/S0304-3991(01)00120-6

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The spatial resolution of three-dimensional atom probe is known to be mainly controlled by the aberrations of ion trajectories near the specimen surface. An analytical model accounting for the spatial overlaps that occur near phase interfaces is described. This model makes it possible to correct the apparent composition of small spherical precipitates in order to determine the true composition. The prediction of the overlap rate as a function of the particle size was found in remarkably good agreement with the simulations of ion trajectories that were made. The thickness of the mixed zone around beta precipitates was found to be of 0.3 nm for a normalised evaporation field of beta phase of 0.8. Using simulations, the overlap rate could be parameterised as a function of the apparent atomic density observed in particles. This model has been applied to copper precipitation in FeCu. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：145 / 153

页数：9

共 13 条

[1] A GENERAL PROTOCOL FOR THE RECONSTRUCTION OF 3D ATOM-PROBE DATA [J].

BAS, P ;

BOSTEL, A ;

DECONIHOUT, B ;

BLAVETTE, D .

APPLIED SURFACE SCIENCE, 1995, 87-8 (1-4) :298-304

[2] AN ATOM-PROBE FOR 3-DIMENSIONAL TOMOGRAPHY [J].

BLAVETTE, D ;

BOSTEL, A ;

SARRAU, JM ;

DECONIHOUT, B ;

MENAND, A .

NATURE, 1993, 363 (6428) :432-435

[3] Three-dimensional imaging of chemical order with the tomographic atom-probe [J].

Blavette, D ;

Déconihout, B ;

Chambreland, S ;

Bostel, A .

ULTRAMICROSCOPY, 1998, 70 (03) :115-124

[4] APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS [J].

CEREZO, A ;

GODFREY, TJ ;

SMITH, GDW .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (06) :862-866

[5] FIM-ATOM PROBE STUDY OF PRECIPITATION OF COPPER FROM IRON-1.4 AT PCT COPPER .2. ATOM PROBE ANALYSES [J].

GOODMAN, SR ;

BRENNER, SS ;

LOW, JR .

METALLURGICAL TRANSACTIONS, 1973, 4 (10) :2371-2378

[6] LATERAL AND DEPTH SCALE CALIBRATION OF THE POSITION-SENSITIVE ATOM-PROBE [J].

HYDE, JM ;

CEREZO, A ;

SETNA, RP ;

WARREN, PJ ;

SMITH, GDW .

APPLIED SURFACE SCIENCE, 1994, 76 (1-4) :382-391

[7] LOCAL MAGNIFICATION EFFECTS IN THE ATOM PROBE [J].

MILLER, MK ;

HETHERINGTON, MG .

SURFACE SCIENCE, 1991, 246 (1-3) :442-449

[8]

PAREIGE P, 1994, THESIS U ROUEN, P33

[9]

PAREIGE P, 1995, SCRIPTA METALL, V337, P1033

[10] Trajectories of field emitted ions in 3D atom-probe [J].

Vurpillot, F ;

Bostel, A ;

Menand, A ;

Blavette, D .

EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 1999, 6 (02) :217-221

← 1 2 →