Sputtered films of Er3+-doped gallium lanthanum sulfide glass

被引：16

作者：

Frantz, JA

Sanghera, JS

Shaw, LB

Villalobos, G

Aggarwal, ID

Hewak, DW

机构：

[1] SFA Inc, Crofton, MD 21114 USA

[2] USN, Res Lab, Washington, DC 20375 USA

[3] Univ Southampton, Optoelect Res Ctr, Southampton SO17 1BJ, Hants, England

来源：

MATERIALS LETTERS | 2006年 / 60卷 / 11期

关键词：

glasses; optical materials and properties; deposition; thin films;

D O I：

10.1016/j.matlet.2005.11.028

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Thin films of Er3+-doped gallium lanthanunn sulfide (GLS) glass were prepared by RF magnetrosputtering onto fused silica and BK7 glass substrates. The films wef characterised by use of SEM imaging, X-ray diffractometry, and energy dispersive spectrometry. They are shown to be glassy, uniform in composition , and to exhibit an RMS surface roughness of < 8 angstrom. The flourescene lifetimes of the I-4(11/2) -> I-4(13/2) and I-4(13/2) -> I-4(15/2) transitions of E3+ were measured at each processing stage. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：1350 / 1353

页数：4

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