Novel scanning technique for ultra-precise measurement of slope and topography of flats, aspheres and complex surfaces

被引:23
作者
Weingärtner, I [1 ]
Schulz, M [1 ]
机构
[1] Phys Tech Bundesanstalt, D-3300 Braunschweig, Germany
来源
OPTICAL FABRICATION AND TESTING | 1999年 / 3739卷
关键词
nanometry; ultra-precise optical measurements; flats; steep aspheres; complex surfaces; optical scanning techniques;
D O I
10.1117/12.360154
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A novel optical scanning technique for testing flats, aspheres and complex surfaces is presented, which offers ultra-precision for the measurement of slope and topography. The scanning technique is based on a combination of two principles, namely to perform difference measurements for slopes with large shears and to use only a single pentagon prism for the difference measurements, keeping the angular position of the pentagon prism constant in space. The combination of these two principles eliminates the influences of all first and second-order errors of the scanning facility, as this scanning technique is traced back exclusively to the units of angle and length. Especially whole-body movement of the artefact under test and distortion of the facility itself do not result in errors. The evaluation of difference measurements with large shears has become possible very recently with high accuracy and high lateral resolution because an error-free algorithm was developed. It is further a special feature of this technique that it measures differences of slopes and, consequently, allows the measurement of aspheres and complex surfaces with large asphericities.
引用
收藏
页码:274 / 282
页数:9
相关论文
共 10 条
[1]  
*BAUER ASS INC, MOD 100 PROF
[2]  
*CONT OPT CORP, LONG TRAC PROF LTP
[3]  
GLENN P, 1991, P SOC PHOTO-OPT INS, V1531, P54
[4]  
*NAT PHYS LAB, NEW FLATN MEAS PROF
[5]  
SHIOZAWA H, 1998, AM SOC PREC ENG, V18, P15
[6]  
1997, Patent No. 197201229
[7]  
1998, Patent No. 198332696
[8]  
1998, Patent No. 198293828
[9]  
1998, Patent No. 198549423
[10]  
1998, Patent No. 198421907