A flexible way of modeling the long-term cost competitiveness of a semiconductor product

被引:15
作者
Chen, Toly [1 ]
机构
[1] Feng Chia Univ, Dept Ind Engn & Syst Management, Taichung 40724, Taiwan
关键词
Competitiveness; Cost; Long term; Collaborative; Fuzzy; Learning; MIDTERM COMPETITIVENESS; FNP APPROACH; FUZZY; INDUSTRY;
D O I
10.1016/j.rcim.2012.04.010
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Cost competitiveness has received ever-growing attention in the era of globalization. However, the definition and measurement of cost competitiveness has not been sufficiently explored. For these reasons, a flexible approach is proposed in this study to assess the long-term cost competitiveness of a product. First, a fuzzy collaborative intelligence approach is applied to estimate the unit cost. The midterm cost competitiveness of the product is then assessed by comparing the estimated unit cost with the competitive region. The assessment result is expressed with a less restrictive shape and is therefore more flexible than assessments from the traditional methods. Subsequently, the long-term cost competitiveness is derived by observing the trend in the medium term. After the proposed methodology had been applied to a practical example, several valuable results were obtained; these successes indicate this method to be a viable strategy in planning related activities. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:31 / 40
页数:10
相关论文
共 37 条
[1]  
Al-Refaie A., 2011, INT J FUZZY SYSTEM A, V1, P43, DOI [10.4018/ijfsa.2011040104, DOI 10.4018/IJFSA.2011040104]
[2]  
[Anonymous], HARVARD BUSINESS REV
[3]  
[Anonymous], 2006, P INT C MATH STAT MO
[4]  
Armstrong E., 1989, P IEEE SEMI INT SEM
[5]  
Carnes R., 1991, P 1991 IEEE SEMI INT
[6]   A hybrid fuzzy and neural approach for evaluating the cost competitiveness of a semiconductor product [J].
Chen T. .
International Journal of Technology Intelligence and Planning, 2010, 6 (04) :373-386
[7]  
Chen T., 2011, INT J FUZZY SYSTEM A, V1, P36
[8]   A fuzzy-neural system incorporating unequally important expert opinions for semiconductor yield forecasting [J].
Chen, Toly ;
Lin, Yu-Cheng .
INTERNATIONAL JOURNAL OF UNCERTAINTY FUZZINESS AND KNOWLEDGE-BASED SYSTEMS, 2008, 16 (01) :35-58
[10]  
Chen T, 2012, INT J INNOV COMPUT I, V8, P583