Apoptosis detection in brain using low-magnification dark-field microscopy

被引:13
作者
Lange, MS [1 ]
Johnston, MV
Tseng, EE
Baumgartner, WA
Blue, ME
机构
[1] Johns Hopkins Univ, Sch Med, Kennedy Krieger Inst, Baltimore, MD 21205 USA
[2] Johns Hopkins Univ, Sch Med, Dept Neurol, Baltimore, MD 21205 USA
[3] Johns Hopkins Univ, Sch Med, Dept Pediat, Baltimore, MD 21205 USA
[4] Johns Hopkins Univ, Sch Med, Div Cardiac Surg, Baltimore, MD 21205 USA
关键词
programmed cell death; ischemia; Nissl; neuropathology; development;
D O I
10.1006/exnr.1999.7097
中图分类号
Q189 [神经科学];
学科分类号
071006 ;
摘要
Apoptosis or programmed cell death is a feature of normal brain development and a response to brain injury. Cells undergoing apoptosis have a characteristic morphology that normally can only be appreciated at high magnification. Using dark-field transmitted light microscopy to examine Nissl-stained material, we detected groups of apoptotic cells at much lower magnifications than often were required in the two injury models we tested. This method was useful for screening entire brain sections to assess regional and global patterns of injury. We predict that this technique in which we detect the clumped chromatin associated with apoptosis can be applied to other types of tissue. (C) 1999 Academic Press.
引用
收藏
页码:254 / 260
页数:7
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