Standing wave detection and interferometer application using a photodiode thinner than optical wavelength

被引：35

作者：

Sasaki, M ^{[1
]}

Mi, XY ^{[1
]}

Hane, K ^{[1
]}

机构：

[1] Tohoku Univ, Dept Mechatron & Precis Engn, Sendai, Miyagi 9808579, Japan

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 14期

关键词：

D O I：

10.1063/1.124898

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A thin film photodiode whose active layer is thinner than the wavelength of the incident light is described. A part of the incident photon is detected and the rest transmits through the thin film photodiode without absorption. Being inserted in the optical field, this sensor is applied to construct the new interferometer detecting the intensity profile of the standing wave of the thinnest interference fringe. (C) 1999 American Institute of Physics. [S0003-6951(99)03740-7].

引用

页码：2008 / 2010

页数：3

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