Adsorption of fluorinated C60 on the Si(111)-(7 x 7) surface studied by scanning tunneling microscopy and high-resolution electron energy loss spectroscopy

被引:8
作者
Fujikawa, Y [1 ]
Sadowski, JT
Kelly, KF
Nakayama, KS
Mickelson, ET
Hauge, RH
Margrave, JL
Sakurai, T
机构
[1] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan
[2] Rice Univ, Dept Chem, Houston, TX 77005 USA
[3] Rice Univ, Rice Quantum Inst, Houston, TX 77005 USA
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2002年 / 41卷 / 01期
关键词
STM; HREELS; fluorine; C-60; Si(111)-(7 x 7);
D O I
10.1143/JJAP.41.245
中图分类号
O59 [应用物理学];
学科分类号
摘要
adsorption structure of fluorinated C-60 molecules deposited on the Si(111)-(7 x 7) surface was studied using scanning tunneling microscopy (STM) and high-resolution electron energy loss spectroscopy (HREELS). The results of HREELS revealed the existence of the silicon-fluorine vibration modes with the energy of 103-107 meV, indicating that some of the fluorine atoms were detached from the molecules and chemisorbed to the surface. These fluorine adsorption sites were observed around the adsorbed molecules directly in the STM images. Many of the fluorine-adsorbed sites were found to form thread-like structures. Random formation of the F-Si bonds on the surface prohibits the fluorinated fullerene's freedom from forming an ordered monolayer on the Si(111)-(7 x 7) surface.
引用
收藏
页码:245 / 249
页数:5
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