New electrically conductive adhesives filled with low-melting-point alloy fillers

被引:21
作者
Kim, JM
Yasuda, K
Rito, M
Fujimoto, K
机构
[1] Osaka Univ, Grad Sch Engn, Dept Mfg Sci, Suita, Osaka 5650871, Japan
[2] Kansai Elect Power Co Ltd, Sakaiko Power Plant, Osaka 5308270, Japan
关键词
conductive path; contact resistance; electrically conductive adhesive; flip chip bonding; low-melting-point alloy; microelectronic and optoelectronic applications; reduction capability;
D O I
10.2320/matertrans.45.157
中图分类号
T [工业技术];
学科分类号
08 [工学];
摘要
A new class of electrically conductive adhesives (ECAs) has been developed using two different resin materials and a low-melting-point alloy filler powder. The curing or cross-linking behaviors of base resin materials and the melting behavior of filler metal were examined using a differential scanning calorimetry (DSC) instrument. The effects of the reduction capability of base resin material, metal filler volume fraction, and joint height on the coalescence of filler, and morphology of conductive path were examined using a cross-sectional optical laser microscope. The two different types of conductive paths (necking-type and bump-type) were achieved by the coalescence and wetting characteristics of melted fillers into new formulations. The results show a good metallurgical connection and a low contact resistance even at a low filler metal volume fraction of 30%.
引用
收藏
页码:157 / 160
页数:4
相关论文
共 14 条
[1]
Reliability investigations on conductive adhesive joints with emphasis on the mechanics of the conduction mechanism [J].
Dudek, R ;
Berek, H ;
Fritsch, T ;
Michel, B .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2000, 23 (03) :462-469
[2]
刘家仁, 1999, [癌变·畸变·突变, Carcinogenesis, Teratogenesis and Mutagenesis], P36
[3]
ELECTRICALLY CONDUCTIVE ADHESIVES - A PROSPECTIVE ALTERNATIVE FOR SMD SOLDERING [J].
JAGT, JC ;
BERIS, PJM ;
LIJTEN, GFCM .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING, 1995, 18 (02) :292-298
[4]
Development of conducting adhesive materials for microelectronic applications [J].
Kang, SK ;
Purushothaman, S .
JOURNAL OF ELECTRONIC MATERIALS, 1999, 28 (11) :1314-1318
[5]
3-D packaging methodologies for microsystems [J].
Kelly, G ;
Morrissey, A ;
Alderman, J ;
Camon, H .
IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2000, 23 (04) :623-630
[6]
PERCOLATION AND CONDUCTION [J].
KIRKPATRICK, S .
REVIEWS OF MODERN PHYSICS, 1973, 45 (04) :574-588
[7]
Development and characterization of single mode microwave cured adhesives for electronics packaging application [J].
Li, SM ;
Liu, JH .
52ND ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2002 PROCEEDINGS, 2002, :1147-1150
[8]
Liu JH, 1998, 3RD INTERNATIONAL CONFERENCE ON ADHESIVE JOINING AND COATING TECHNOLOGY IN ELECTRONICS MANUFACTURING 1998, PROCEEDINGS, P1, DOI 10.1109/ADHES.1998.741996
[9]
Development of conductive adhesives for solder replacement [J].
Lu, DQ ;
Wong, CP .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2000, 23 (04) :620-626
[10]
Isotropic conductive adhesives filled with low-melting-point alloy fillers [J].
Lu, DQ ;
Wong, CP .
IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 2000, 23 (03) :185-190