The Origin of Slow Carrier Transport in BiVO4 Thin Film Photoanodes: A Time-Resolved Microwave Conductivity Study

被引：493

作者：

Abdi, Fatwa F. ^{[1
]}

Savenije, Tom J. ^{[2
]}

May, Matthias M. ^{[3
]}

Dam, Bernard ^{[1
]}

van de Krol, Roel ^{[3
]}

机构：

[1] Delft Univ Technol, Dept Chem Engn, NL-2600 GA Delft, Netherlands

[2] Delft Univ Technol, Dept Chem Engn, NL-2600 GA Delft, Netherlands

[3] Helmholtz Zentrum Berlin Mat & Energie Gmbh, Inst Solar Fuels, D-14109 Berlin, Germany

来源：

JOURNAL OF PHYSICAL CHEMISTRY LETTERS | 2013年 / 4卷 / 16期

关键词：

WATER OXIDATION; DYNAMICS; PHOTOELECTROLYSIS; PHOTOCATALYSTS; RECOMBINATION; ULTRAFAST; ELECTRON; CATALYST;

D O I：

10.1021/jz4013257

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We unravel for the first time the origin of the poor carrier transport properties of BiVO4, a promising metal oxide photoanode for solar water splitting. Time-resolved microwave conductivity (TRMC) measurements reveal an (extrapolated) carrier mobility of similar to 4 x 10(-2) cm(2) V-1 s(-1) for undoped BiVO4 under similar to 4 sun illumination conditions, which is unusually low for a photoanode material. The poor carrier mobility is compensated by an unexpectedly long carrier lifetime of 40 ns. This translates to a relatively long diffusion length of 70 nm, consistent with the high quantum efficiencies reported for BiVO4 photoanodes. Tungsten (W) doping is found to strongly decrease the carrier mobility by introducing intermediate-depth donor defects as carrier traps. At the same time, the increased carrier density improves the overall photoresponse, which confirms that bulk electronic conductivity is one of the main performance bottlenecks for BiVO4.

引用

页码：2752 / 2757

页数：6

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